日本語
Hiroshima City University 
Graduate School of Information Sciences 
Dept. of Systems Engineering 

Assistant Professor 
Tsuji Katsuhiro 

 

Career
広島市立大学情報科学部助手  1996/04/01-2007/03/31 
広島市立大学大学院情報科学研究科助教  2007/04/01-Present 

Licenses and qualifications
第一種衛生管理者  2015/01/23 

Research Areas
Electronic Device/Electronic Equipment 

Research keywords
Semiconductor devices 
Integrated Circuits 
Device modeling 
Device simulation 
Parameter extraction 

Papers
Research paper (scientific journal)  Joint  Study on Threshold Voltage Evaluated by Charge-Based Capacitance Measurement  Katsuhiro TSUJI, Kazuo TERADA, Ryo TAKEDA, and Hisato FUJISAKA  IEICE TRANSACTIONS on Electronics  The Institute of Electronics, Information and Communication Engineers  VOL.E99-C/ NO.4, 466-473  2016/04 
Research paper (scientific journal)  Joint  Development of Test Structure for Variability Evaluation Using Charge-Based Capacitance Measurement  Katsuhiro TSUJI, Kazuo TERADA, and Ryota KIKUCHI  IEICE TRANSACTIONS on Electronics  The Institute of Electronics, Information and Communication Engineers  VOL.E97-C/ NO.11, 1117-1123  2014/11/01 
Research paper (scientific journal)  Joint  Reconsideration of Effective Channel Length for Metal-Oxide-Semiconductor Field Effect Transistor  Kazuo Terada, Kazuhiko Sanai, Katsuhiro Tsuji  Japanese Journal of Applied Physics  Vol. 53, 064303-  2014/05 
Research paper (international conference proceedings)  Joint  Comparison of Channel Length Extracted from Gate Capacitance with That Extracted from Channel Resistance  Katsuhiro Tsuji and Kazuo Terada  Proc. Int. Conf. on Microelectronic Test Structures  87-91  2014/03 
Research paper (international conference proceedings)  Joint  Measurement of Channel Length Variability  Kazuo Terada and Katsuhiro Tsuji  Proc. IEEE Workshop on Variability Modeling and Characterization at ICCAD  2013/11 
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Research presentations
Poster presentation  Difference in Threshold-Voltage Variability Caused by Measurement Method  Proc. IEEE Workshop on Variability Modeling and Characterization at ICCAD  2012/11 
Oral presentation(general)  実効チャネル長に対するチャネル不純物濃度分布の影響  応用物理学関係連合講演会  2012/03 
Poster presentation  gmばらつきに対する局所VTHゆらぎの影響  応用物理学関係連合講演会  2012/03 
Poster presentation  Threshold Voltage Variation Extracted from MOSFET C-V Curves by Charge-Based Capacitance Measurement  Proc. Int. Conf. on Microelectronic Test Structures  2012/03 
Oral presentation(general)  Evaluation of MOSFET C-V Curve Variation Using Test Structure for Charge-Based Capacitance Measurement  Proc. Int. Conf. on Microelectronic Test Structures  2011/04 
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Allotted class
物理学概論 
e-ラーニング英語III 
システム工学実験I 
外書講読演習II 
システム工学実験II 
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Memberships of academic societies
The Japan Society of Applied Physics  1996/09-Present 
The Institute of Electronics, Information and Communication Engineers  1995/08-Present 
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Open lecture
研究室見学(11月27日 祇園北高校)  Open lecture  2012/11-Present 
研究室紹介(11月30日、祇園北高校)  Others  2011/11-Present 
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